Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films using Linkam’s HFS600E-PB4

Researchers use a Linkam probe stage, the HFS600E-PB4 to study the relationship between vertical interfaces and dielectric properties in thin nanocomposite films.

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Li, W., Zhang, W., Wang, L. et al. Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films. Sci Rep 5, 11335 (2015). https://doi.org/10.1038/srep11335